화학공학소재연구정보센터
검색결과 : 20건
No. Article
1 Intermixing behaviors of PCBM with CuPc on Au(111) surface
Masui A, Sakaue H, Takahagi T, Suzuki H
Chemical Physics Letters, 661, 215, 2016
2 New method to calibrate binding energy using Au nanocolloids in X-ray photoelectron analysis of diamondlike carbon films with different electrical resistivities
Takabayashi S, Okamoto K, Motomitsu K, Terayama A, Nakatani T, Sakaue H, Suzuki H, Takahagi T
Applied Surface Science, 254(9), 2666, 2008
3 Epitaxial growth of Cu nanodot arrays using an AAO template on a Si substrate
Shimizu T, Nagayanagi M, Ishida T, Sakata O, Oku T, Sakaue H, Takahagi T, Shingubara S
Electrochemical and Solid State Letters, 9(4), J13, 2006
4 Bottom-up copper fill with addition of mercapto alkyl carboxylic acid in electroless plating
Wang ZL, Obata R, Sakaue H, Takahagi T, Shingubara S
Electrochimica Acta, 51(12), 2442, 2006
5 Characterization of electroless-plated Cu film over Pd catalytic layer formed by an ionized cluster beam
Wang ZL, Shingubara S, Sakaue H, Takahagi T
Journal of the Electrochemical Society, 152(10), C684, 2005
6 Wet treatment for preparing atomically smooth Si(100) wafer surface
Sakaue H, Taniguchi Y, Okamura Y, Shingubara S, Takahagi T
Applied Surface Science, 234(1-4), 439, 2004
7 Self-organization of a porous alumina nanohole array using a sulfuric/oxalic acid mixture as electrolyte
Shingubara S, Morimoto K, Sakaue H, Takahagi T
Electrochemical and Solid State Letters, 7(3), E15, 2004
8 Bottom-up fill of copper in deep submicrometer holes by electroless plating
Shingubara S, Wang ZL, Yaegashi O, Obata R, Sakaue H, Takahagi T
Electrochemical and Solid State Letters, 7(6), C78, 2004
9 Focal-point anchoring: Large proton relaxivity observed for gadolinium-cored dendrimer complexes in water
Kawa M, Takahagi T
Journal of Polymer Science Part B: Polymer Physics, 42(14), 2680, 2004
10 Bottom-up fill for submicrometer copper via holes of ULSIs by electroless plating
Wang ZL, Yaegashi O, Sakaue H, Takahagi T, Shingubara S
Journal of the Electrochemical Society, 151(12), C781, 2004