검색결과 : 3건
No. | Article |
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1 |
Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs Tokutomi T, Tanakamaru S, Iwasaki TO, Takeuchi K Solid-State Electronics, 111, 129, 2015 |
2 |
A scaling scenario of asymmetric coding to reduce both data retention and program disturbance of NAND flash memories Doi M, Tanakamaru S, Takeuchi K Solid-State Electronics, 92, 63, 2014 |
3 |
Post-manufacturing, 17-times acceptable raw bit error rate enhancement, dynamic codeword transition ECC scheme for highly reliable solid-state drives, SSDs Tanakamaru S, Fukuda M, Higuchi K, Esumi A, Ito M, Li K, Takeuchi K Solid-State Electronics, 58(1), 2, 2011 |