1 |
Visible light photocatalysis of amorphous Cl-Ta2O5-x microspheres for stabilized hydrogen generation Yu X, Zhao JJ, Huang JL, Zhao JW, Guo YF, Tang YT, Ma XQ, Li ZH, Guo QH, Zhao JW Journal of Colloid and Interface Science, 572, 141, 2020 |
2 |
Influence of ion beam parameters onto two-dimensional optical thin film thickness distributions deposited by ion beam sputtering Sakiew W, Schrameyer S, Jupe M, Schwerdtner P, Erhart N, Starke K, Ristau D Thin Solid Films, 682, 109, 2019 |
3 |
High annealing stability of spin-dependent transport properties in perpendicular multilayers with Ta2O5 interfacial layer Jiang SL, Liu Q, Zhao YQ Thin Solid Films, 685, 234, 2019 |
4 |
High-Z Nanostructured Ceramics in Radiotherapy: First Evidence of Ta2O5-Induced Dose Enhancement on Radioresistant Cancer Cells in an MV Photon Field Brown R, Tehei M, Oktaria S, Briggs A, Stewart C, Konstantinov K, Rosenfeld A, Corde S, Lerch M Particle & Particle Systems Characterization, 31(4), 500, 2014 |
5 |
Soft chemistry routes to transparent metal oxide thin films. The case of sol-gel synthesis and structural characterization of Ta2O5 thin films from tantalum chloromethoxide Epifani M, Zamani R, Arbiol J, Fabrega C, Andreu T, Pace GB, Siciliano P, Morante JR Thin Solid Films, 555, 39, 2014 |
6 |
Corrosion resistance and biocompatibility of titanium surface coated with amorphous tantalum pentoxide Sun YS, Chang JH, Huang HH Thin Solid Films, 528, 130, 2013 |
7 |
Growth characteristics and electrical properties of Ta2O5 grown by thermal and O-3-based atomic layer deposition on TiN substrates for metal-insulator-metal capacitor applications Kim MK, Kim WH, Lee T, Kim H Thin Solid Films, 542, 71, 2013 |
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Preparation and properties of high refractive index tantalum pentoxide coatings deposited by plasma ion assisted deposition with xenon or argon assistance Stenzel O, Wilbrandt S, Schlegel R, Bohme M, Kaiser N Thin Solid Films, 542, 295, 2013 |
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Mechanistic interaction study of thin oxide dielectric with conducting organic electrode Sharma H, Sethi K, Raj PM, Gerhardt RA, Tummala R Materials Chemistry and Physics, 134(1), 508, 2012 |
10 |
Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide Buchner K, Ehrhardt N, Cahill BP, Hoffmann C Thin Solid Films, 519(19), 6480, 2011 |