검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy Li QH, Gan FX Applied Surface Science, 181(3-4), 239, 2001 |
| No. | Article |
|---|---|
| 1 |
Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy Li QH, Gan FX Applied Surface Science, 181(3-4), 239, 2001 |