검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors Jung H, Choi S, Jang JT, Yoon J, Lee J, Lee Y, Rhee J, Ahn G, Yu HR, Kim DM, Choi SJ, Kim DH Solid-State Electronics, 140, 80, 2018 |
| 2 |
On the inclusion of Lorentz force effects in TCAD simulations Schoemaker W, Meuris P, Jimenez J, Galy P Solid-State Electronics, 65-66, 103, 2011 |