검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Reconfigurable Special Test Circuit of physics-based IGBT models parameter extraction Rodriguez MA, Claudio A, Cotorogea M, Gonzalez LH, Aguayo J Solid-State Electronics, 54(11), 1246, 2010 |
| 2 |
Measurement of the MOSFET drain current variation under high gate voltage Terada K, Chagawa T, Xiang JY, Tsuji K, Tsunomura T, Nishida A Solid-State Electronics, 53(3), 314, 2009 |
| 3 |
A test circuit for measuring MOSFET threshold voltage mismatch Terada K, Eimitsu M, Fukeda K Solid-State Electronics, 49(5), 818, 2005 |