검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs Karatsori TA, Pastorek M, Theodorou CG, Fadjie A, Wichmann N, Desplanque L, Wallart X, Bollaert S, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 143, 56, 2018 |
| 2 |
Drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs Karatsori TA, Theodorou CG, Haendler S, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 128, 31, 2017 |
| 3 |
Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature Theodorou CG, Ioannidis EG, Haendler S, Josse E, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 117, 88, 2016 |
| 4 |
Dynamic variability in 14 nm FD-SOI MOSFETs and transient simulation methodology Theodorou CG, Ioannidis EG, Haendler S, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 111, 100, 2015 |
| 5 |
Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction Karatsori TA, Theodorou CG, Ioannidis EG, Haendler S, Josse E, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 111, 123, 2015 |
| 6 |
Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5 mu m down to 20 nm Ioannidis EG, Haendler S, Theodorou CG, Lasserre S, Dimitriadis CA, Ghibaudo G Solid-State Electronics, 95, 28, 2014 |
| 7 |
Origin of the low-frequency noise in n-channel FinFETs Theodorou CG, Fasarakis N, Hoffman T, Chiarella T, Ghibaudo G, Dimitriadis CA Solid-State Electronics, 82, 21, 2013 |
| 8 |
Symmetrical unified compact model of short-channel double-gate MOSFETs Papathanasiou K, Theodorou CG, Tsormpatzoglou A, Tassis DH, Dimitriadis CA, Bucher M, Ghibaudo G Solid-State Electronics, 69, 55, 2012 |