검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Multi-Subband Monte Carlo simulations of I-ON degradation due to fin thickness fluctuations in FinFETs Serra N, Palestri P, Smit GDJ, Selmi L Solid-State Electronics, 53(4), 424, 2009 |
| No. | Article |
|---|---|
| 1 |
Multi-Subband Monte Carlo simulations of I-ON degradation due to fin thickness fluctuations in FinFETs Serra N, Palestri P, Smit GDJ, Selmi L Solid-State Electronics, 53(4), 424, 2009 |