검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Ellipsometric porosimetry on pore-controlled TiO2 layers Rosu DM, Ortel E, Hodoroaba VD, Kraehnert R, Hertwig A Applied Surface Science, 421, 487, 2017 |
| 2 |
Thin film thickness measurements using Scanning White Light Interferometry Maniscalco B, Kaminski PM, Walls JM Thin Solid Films, 550, 10, 2014 |