검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
XRD analysis of strain states in epitaxial YSZ/RE2O3 (RE = Y, Er) multilayers as a function of layer thickness Keppner J, Korte C, Schubert J, Zander W, Ziegner M, Stolten D Solid State Ionics, 273, 2, 2015 |
| 2 |
The effects of annealing temperature on the photoluminescence from silicon nitride multilayer structures Scardera G, Puzzer T, Perez-Wurfl I, Conibeer G Journal of Crystal Growth, 310(15), 3680, 2008 |
| 3 |
Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique Sahoo NK, Tokas RB, Thakur S Applied Surface Science, 253(4), 1787, 2006 |
| 4 |
Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth Fabreguette F, Imhoff L, Heintz O, Maglione M, Domenichini B, de Lucas MCM, Sibillot P, Bourgeois S, Sacilotti M Applied Surface Science, 175, 685, 2001 |