검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements Kriso C, Triozon F, Delerue C, Schneider L, Abbate F, Nolot E, Rideau D, Niquet YM, Mugny G, Tavernier C Solid-State Electronics, 129, 93, 2017 |
| 2 |
Electron mobility and spin lifetime enhancement in strained ultra-thin silicon films Osintsev D, Sverdlov V, Selberherr S Solid-State Electronics, 112, 46, 2015 |
| 3 |
Subband splitting and surface roughness induced spin relaxation in (001) silicon SOI MOSFETs Osintsev D, Baumgartner O, Stanojevic Z, Sverdlov V, Selberherr S Solid-State Electronics, 90, 34, 2013 |
| 4 |
Control of plasma process instabilities during thin silicon film deposition Hrunski D, Grahlert W, Beese H, Kilper T, Gordijn A, Appenzeller W Thin Solid Films, 517(14), 4188, 2009 |