검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Ultra-thin gate oxide reliability projections Weir BE, Alam MA, Silverman PJ, Baumann F, Monroe D, Bude JD, Timp GL, Hamad A, Ma Y, Brown MM, Hwang D, Sorsch TW, Ghetti A, Wilk GD Solid-State Electronics, 46(3), 321, 2002 |
| 2 |
Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors Kleiman RN, O'Malley ML, Baumann FH, Garno JP, Timp GL Journal of Vacuum Science & Technology B, 18(4), 2034, 2000 |
| 3 |
Progress toward a 30 nm silicon metal-oxide-semiconductor gate technology Tennant DM, Timp GL, Ocola LE, Green M, Sorsch T, Kornblit A, Klemens F, Kleiman R, Kim Y, Timp W Journal of Vacuum Science & Technology B, 17(6), 3158, 1999 |