화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Mapping of X-ray induced luminescence using a SNOM probe
Jandard F, Fauquet C, Dehlinger M, Ranguis A, Bjeoumikhov A, Ferrero S, Pailharey D, Dahmani B, Tonneau D
Applied Surface Science, 267, 81, 2013
2 Electric field induced motion of metallic droplets: Application to submicron contactor
Dallaporta H, Prestigiacomo M, Bedu F, Tonneau D, Chatain D, Sudraud P
Journal of Vacuum Science & Technology B, 28(4), L35, 2010
3 Electrical conductivity of ultra-thin silicon nanowires
Rochdi N, Tonneau D, Jandard F, Dallaporta H, Safarov V, Gautier J
Journal of Vacuum Science & Technology B, 26(1), 159, 2008
4 Structural and electrical studies of conductive nanowires prepared by focused ion beam induced deposition
Reguer A, Bedu F, Tonneau D, Dallaporta H, Prestigiacomo M, Houel A, Sudraud P
Journal of Vacuum Science & Technology B, 26(1), 175, 2008
5 Directed growth of horizontal silicon nanowires by laser induced decomposition of silane
Abed H, Charrier A, Dallaporta H, Safarov V, Jamgotchian H, Tonneau D
Journal of Vacuum Science & Technology B, 24(3), 1248, 2006
6 Deposition of gold nanofeatures on silicon samples by field-induced deposition using a scanning tunneling microscope
Abed H, Jamptchian H, Dallaporta H, Gely B, Bindzi P, Chatain D, Nitsche S, Chaudanson D, Cambril E, Safarov V, Tonneau D
Journal of Vacuum Science & Technology B, 23(4), 1543, 2005
7 CCR5 N-terminus peptides enhance X4 HIV-1 infection by CXCR4 up-regulation
Dettin M, Zanchetta M, Pasquato A, Borrello M, Piatier-Tonneau D, Di Bello C, De Rossi A
Biochemical and Biophysical Research Communications, 307(3), 640, 2003
8 High aspect ratio nano-oxidation of silicon with noncontact atomic force microscopy
Clement N, Tonneau D, Gely B, Dallaporta H, Safarov V, Gautier J
Journal of Vacuum Science & Technology B, 21(6), 2348, 2003
9 Direct patterning of nanostructures by field-induced deposition from a scanning tunneling microscope tip
Houel A, Tonneau D, Bonnail N, Dallaporta H, Safarov VI
Journal of Vacuum Science & Technology B, 20(6), 2337, 2002
10 STM studies: spatial resolution limits to fit observations in nanotechnology
Szkutnik PD, Piednoir A, Ronda A, Marchi F, Tonneau D, Dallaporta H, Hanbucken M
Applied Surface Science, 164, 169, 2000