검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior Toutah H, Llibre JF, Tala-Ighil B, Boudart B, Mohammed-Brahim T Thin Solid Films, 427(1-2), 340, 2003 |
| 2 |
Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material Toutah H, Tala-Ighil B, Llibre JF, Rahal A, Mourgues K, Helen Y, Brahim TM, Dassow R, Kohler JR Thin Solid Films, 383(1-2), 299, 2001 |