| 1 |
Improved electrical performance and transparency of bottom-gate, bottom-contact single-walled carbon nanotube transistors using graphene source/drain electrodes
Shin HW, Oh JW, Kim YJ, Song JG, Lee CH, Shin KY
Journal of Industrial and Engineering Chemistry, 81, 488, 2020 |
| 2 |
Investigation on the variation of channel resistance and contact resistance of SiZnSnO semiconductor depending on Si contents using transmission line method
Lee BH, Han S, Lee SY
Solid-State Electronics, 139, 15, 2018 |
| 3 |
Multi-wire metallization for solar cells: Contact resistivity of the interface between the wires and In2O3:Sn, In2O3:F, and ZnO:Al layers
Untila GG, Kost TN, Chebotareva AB
Solar Energy, 142, 330, 2017 |
| 4 |
Effects of geometrically extended contact area on electrical properties in amorphous InGaZnO thin film transistors
Kim JS, Joo MK, Piao MX, Ahn SE, Choi YH, Na J, Shin M, Han MJ, Jang HK, Kim GT
Thin Solid Films, 558, 279, 2014 |
| 5 |
Optimization of transparent conductor-embedding front electrodes for efficient light management
Kim M, Kim J, Kim H, Choi J, Park J, Ahn MC, Yi J
Current Applied Physics, 13(5), 808, 2013 |
| 6 |
Effect of CdSe/P3HT composition on electrical and structural properties of bulk hetero-junction solar cell active layer
Truong NTN, Kim WK, Park C
Solar Energy Materials and Solar Cells, 95(1), 167, 2011 |
| 7 |
Contact resistivity measurements of the buried Si-ZnO:Al interface of polycrystalline silicon thin-film solar cells on ZnO:Al
Becker C, Haberlein H, Schope G, Hupkes J, Rech B
Thin Solid Films, 520(4), 1268, 2011 |
| 8 |
Analysis of effective channel length variation for thin-film transistors with edge waviness in source/drain electrodes
Jeong J, Hong Y
Thin Solid Films, 518(22), 6295, 2010 |
| 9 |
The effect of annealing on amorphous indium gallium zinc oxide thin film transistors
Bae HS, Kwon JH, Chang S, Chung MH, Oh TY, Park JH, Lee SY, Pak JJ, Ju BK
Thin Solid Films, 518(22), 6325, 2010 |
| 10 |
An investigation of contact resistance between metal electrodes and amorphous gallium-indium-zinc oxide (a-GIZO) thin-film transistors
Kim WS, Moon YK, Kim KT, Lee JH, Ahn BD, Park JW
Thin Solid Films, 518(22), 6357, 2010 |
