검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Influence of overgrown micropipes in the active area of SIC Schottky diodes on long term reliability Rupp R, Treu M, Turkes P, Beermann H, Scherg T, Preis H, Cerva H Materials Science Forum, 483, 925, 2005 |
| 2 |
Generation of stacking faults in highly doped n-type 4H-SiC substrates Zhang M, Hobgood HM, Treu M, Pirouz P Materials Science Forum, 457-460, 759, 2004 |
| 3 |
Challenges and first results of SiC Schottky diode manufacturing using a 3 inch technology Treu M, Rupp R, Brunner H, Dahlquist F, Hecht C Materials Science Forum, 457-460, 981, 2004 |
| 4 |
Temperature dependence of forward and reverse characteristics of Ti, W, Ta and Ni Schottky diodes on 4H-SiC Treu M, Rupp R, Kapels H, Bartsch W Materials Science Forum, 353-356, 679, 2001 |
| 5 |
Reliability and degradation of metal-oxide-semiconductor capacitors on 4H-and 6H-silicon carbide Treu M, Schorner R, Friedrichs P, Rupp R, Wiedenhofer A, Stephani D, Ryssel H Materials Science Forum, 338-3, 1089, 2000 |
| 6 |
Performance and reliability issues of SiC-Schottky diodes Rupp R, Treu M, Mauder A, Griebl E, Werner W, Bartsch W, Stephani D Materials Science Forum, 338-3, 1167, 2000 |