화학공학소재연구정보센터
검색결과 : 34건
No. Article
1 Effects of plasma treatment time on surface characteristics of indium-tin-oxide film for resistive switching storage applications
Chen PH, Chang TC, Chang KC, Tsai TM, Pan CH, Shih CC, Wu CH, Yang CC, Chen WC, Lin JC, Wang MH, Zheng HX, Chen MC, Sze SM
Applied Surface Science, 414, 224, 2017
2 Protective effect of magnolol-loaded polyketal microparticles on lipopolysaccharide-induced acute lung injury in rats
Tsai TM, Kao CY, Chou CL, Liu LC, Chou TC
Journal of Microencapsulation, 33(5), 401, 2016
3 Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
Chang KC, Chen JH, Tsai TM, Chang TC, Huang SY, Zhang R, Chen KH, Syu YE, Chang GW, Chu TJ, Liu GR, Su YT, Chen MC, Pan JH, Liao KH, Tai YH, Young TF, Sze SM, Ai CF, Wang MC, Huang JW
Journal of Supercritical Fluids, 85, 183, 2014
4 The Use of Chitosan to Enhance Photodynamic Inactivation against Candida albicans and Its Drug-Resistant Clinical Isolates
Chien HF, Chen CP, Chen YC, Chang PH, Tsai TM, Chen CT
International Journal of Molecular Sciences, 14(4), 7445, 2013
5 The resistive switching characteristics in TaON films for nonvolatile memory applications
Chen MC, Chang TC, Chiu YC, Chen SC, Huang SY, Chang KC, Tsai TM, Yang KH, Sze SM, Tsai MJ
Thin Solid Films, 528, 224, 2013
6 The Effect of Silicon Oxide Based RRAM with Tin Doping
Chang KC, Tsai TM, Chang TC, Syu YE, Chuang SL, Li CH, Gan DS, Sze SM
Electrochemical and Solid State Letters, 15(3), H65, 2012
7 Low-Temperature Synthesis of ZnO Nanotubes by Supercritical CO2 Fluid Treatment
Chang KC, Tsai TM, Chang TC, Syu YE, Huang HC, Hung YC, Young TF, Gan DS, Ho NJ
Electrochemical and Solid State Letters, 14(9), K47, 2011
8 Improving Resistance Switching Characteristics with SiGeOx/SiGeON Double Layer for Nonvolatile Memory Applications
Syu YE, Chang TC, Tsai CT, Chang GW, Tsai TM, Chang KC, Tai YH, Tsai MJ, Sze SM
Electrochemical and Solid State Letters, 14(10), H419, 2011
9 Influence of Oxygen Partial Pressure on Resistance Random Access Memory Characteristics of Indium Gallium Zinc Oxide
Chen MC, Chang TC, Huang SY, Chang GC, Chen SC, Huang HC, Hu CW, Sze SM, Tsai TM, Gan DS, Yeh FS, Tsai MJ
Electrochemical and Solid State Letters, 14(12), H475, 2011
10 Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks
Dai CH, Chang TC, Chu AK, Kuo YJ, Hung YC, Lo WH, Ho SH, Chen CE, Shih JM, Chung WL, Chen HM, Dai BS, Tsai TM, Xia GR, Cheng O, Huang CT
Thin Solid Films, 520(5), 1511, 2011