검색결과 : 1건
No. | Article |
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1 |
Thickness dependent integrity of gate oxide on SOI Tsujiuchi M, Iwamatsu T, Naruoka H, Umeda H, Ipposhi T, Maegawa S, Inoue Y Applied Surface Science, 216(1-4), 329, 2003 |
No. | Article |
---|---|
1 |
Thickness dependent integrity of gate oxide on SOI Tsujiuchi M, Iwamatsu T, Naruoka H, Umeda H, Ipposhi T, Maegawa S, Inoue Y Applied Surface Science, 216(1-4), 329, 2003 |