검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Carrier lifetime analysis by photoconductance decay and free carrier absorption measurements Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Hille F, Tutto P, Pavelka T, Wachutka G Journal of the Electrochemical Society, 148(11), G655, 2001 |
| 2 |
Analytical tools for the characterization of power devices Schulze HJ, Frohnmeyer A, Niedernostheide FJ, Simmnacher B, Kolbesen BO, Tutto P, Pavelka T, Wachutka G Journal of the Electrochemical Society, 147(10), 3879, 2000 |
| 3 |
Identification Possibility of Metallic Impurities in P-Type Silicon by Lifetime Measurement Horanyi TS, Tutto P, Kovacsics C Journal of the Electrochemical Society, 143(1), 216, 1996 |