검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Low frequency noise in biaxially strained silicon n-MOSFETs with ultrathin gate oxides Contaret T, Touati B, Ghibaudo G, Boeuf F, Skotnicki T Solid-State Electronics, 51(4), 633, 2007 |
| 2 |
Energy-dependent conduction band mass of SiO2 determined by ballistic electron emission microscopy Ludeke R, Schenk A Journal of Vacuum Science & Technology B, 17(4), 1823, 1999 |