검색결과 : 1건
No. | Article |
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1 |
Control of the slope of field oxide edge and its effects on gate oxide reliability Jang SA, Kim YB, Yeo IS, Lee SK Journal of the Electrochemical Society, 146(1), 270, 1999 |
No. | Article |
---|---|
1 |
Control of the slope of field oxide edge and its effects on gate oxide reliability Jang SA, Kim YB, Yeo IS, Lee SK Journal of the Electrochemical Society, 146(1), 270, 1999 |