검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Trench formation and lateral damage induced by gallium milling of silicon Russo MF, Maazouz M, Giannuzzi LA, Chandler C, Utlaut M, Garrison BJ Applied Surface Science, 255(4), 828, 2008 |
| 2 |
Fundamental Limits to Imaging Resolution for Focused Ion-Beams Orloff J, Swanson LW, Utlaut M Journal of Vacuum Science & Technology B, 14(6), 3759, 1996 |
| 3 |
A Focused Ion-Beam Secondary-Ion Mass-Spectroscopy System Crow GA, Christman L, Utlaut M Journal of Vacuum Science & Technology B, 13(6), 2607, 1995 |