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| No. | Article |
|---|---|
| 1 |
Ultra-Shallow Chemical Characterization of Organic Thin Films Deposited by Plasma and Vacuum-Ultraviolet, Using Angle- and Excitation Energy-Resolved XPS Girard-Lauriault PL, Ruiz JC, Gross T, Wertheimer MR, Unger WES Plasma Chemistry and Plasma Processing, 31(4), 535, 2011 |