검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Thin-film monocrystalline-silicon solar cells made by a seed layer approach on glass-ceramic substrates Gordon I, Vallon S, Mayolet A, Beaucarne G, Poortmans J Solar Energy Materials and Solar Cells, 94(2), 381, 2010 |
| 2 |
X-Ray Photoelectron-Spectroscopy Analyses of Oxide-Masked Polycrystalline SiGe Features Etched in a High-Density Plasma Source Monget C, Vallon S, Bell FH, Vallier L, Joubert O Journal of the Electrochemical Society, 144(7), 2455, 1997 |
| 3 |
Real-Time Ultraviolet Ellipsometry Monitoring of Gate Patterning in a High-Density Plasma Vallon S, Joubert O, Vallier L, Ferrieu F, Drevillon B, Blayo N Journal of Vacuum Science & Technology A, 15(3), 865, 1997 |
| 4 |
Polysilicon-Germanium Gate Patterning Studies in a High-Density Plasma Helicon Source Vallon S, Monget C, Joubert O, Vallier L, Bell FH, Pons M, Regolini JL, Morin C, Sagnes I Journal of Vacuum Science & Technology A, 15(4), 1874, 1997 |
| 5 |
Adhesion mechanisms of silica layers on plasma-treated polymers .1. Polycarbonate Vallon S, Hofrichter A, Guyot L, Drevillon B, KlembergSapieha JE, Martinu L, PoncinEpaillard F Journal of Adhesion Science and Technology, 10(12), 1287, 1996 |
| 6 |
Adhesion mechanisms of silica layers on plasma-treated polymers .2. Polypropylene Vallon S, Brenot R, Hofrichter A, Drevillon B, Gheorghiu A, Senemaud C, KlembergSapieha JE, Martinu L, PoncinEpaillard F Journal of Adhesion Science and Technology, 10(12), 1313, 1996 |
| 7 |
Argon Plasma Treatment of Polycarbonate - In-Situ Spectroellipsometry Study and Polymer Characterizations Vallon S, Drevillon B, Poncinepaillard F, Klembergsapieha JE, Martinu L Journal of Vacuum Science & Technology A, 14(6), 3194, 1996 |
| 8 |
Improvement of the Adhesion of Silica Layers to Polypropylene Induced by Nitrogen Plasma Treatment Vallon S, Hofrichter A, Drevillon B, Klembergsapieha JE, Martinu L, Poncinepaillard F Thin Solid Films, 290-291, 68, 1996 |
| 9 |
Investigation of the Adhesion Mechanisms of Silicon Alloy Thin-Films on Polymer Substrates by Ir Ellipsometry Drevillon B, Rostaing JC, Vallon S Thin Solid Films, 236(1-2), 204, 1993 |