검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry Brunet-Bruneau A, Souche D, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Journal of Vacuum Science & Technology A, 16(4), 2281, 1998 |
| 2 |
Visible and infrared ellipsometry study of ion assisted SiO2 films Souche D, Brunet-Bruneau A, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Thin Solid Films, 313-314, 676, 1998 |
| 3 |
Correlation between microstructure and the optical properties of TiO2 thin films prepared on different substrates Leprince-Wang Y, Yu-Zhang K, Van VN, Souche D, Rivory J Thin Solid Films, 307(1-2), 38, 1997 |
| 4 |
Initial-Stages in the Formation of PtSi on Si(111) as Followed by Photoemission and Spectroscopic Ellipsometry Ley L, Wang Y, Van VN, Fisson S, Souche D, Vuye G, Rivory J Thin Solid Films, 270(1-2), 561, 1995 |
| 5 |
Growth of Low and High Refractive-Index Dielectric Layers as Studied by in-Situ Ellipsometry Van VN, Fisson S, Frigerio JM, Rivory J, Vuye G, Wang Y, Abeles F Thin Solid Films, 253(1-2), 257, 1994 |