검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation Nansen C, Zhang XC, Aryamanesh N, Yan GJ Journal of Food Engineering, 123, 17, 2014 |
| 2 |
Variogram analysis of charge-carrier effective lifetime topograms in mc-Si materials Niemietz K, Wagner A, Grundig-Wendrock B, Stoyan D, Niklas JR Solar Energy Materials and Solar Cells, 94(2), 164, 2010 |