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| No. | Article |
|---|---|
| 1 |
A subnanometric resolution method for studying local atomic structure of interface and surface of multilayered nanoheterostructure thin films Babanov YA, Vasin VV, Ponomarev DA, Devyaterikov DI, Romashev LN, Ustinov VV Thin Solid Films, 656, 44, 2018 |