검색결과 : 3건
No. | Article |
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1 |
Oxygen diffusion in TiO2 films studied by electron and ion Rutherford backscattering Marmitt GG, Nandi SK, Venkatachalam DK, Elliman RG, Vos M, Grande PL Thin Solid Films, 629, 97, 2017 |
2 |
Effect of crystallization on the reliability of unipolar resistive-switching in HfO2-based dielectrics Saleh MN, Venkatachalam DK, Elliman RG Current Applied Physics, 14, S88, 2014 |
3 |
Damage tolerance of Ti3SiC2 to high energy iodine irradiation Zhang L, Qi Q, Shi LQ, O'Connor DJ, King BV, Kisi EH, Venkatachalam DK Applied Surface Science, 258(17), 6281, 2012 |