검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Data collection requirements for the analysis of residual stress in polycrystalline coatings Vermeulen AC, Gotz D Materials Science Forum, 524-525, 795, 2006 |
| 2 |
The sensitivity of focusing, parallel beam and mixed optics to alignment errors in XRD residual stress measurements Vermeulen AC Materials Science Forum, 490-491, 131, 2005 |
| 3 |
Line profile analysis (LPA) methods: Systematic ranking of the quality of their basic assumptions Vermeulen AC, Delhez R Materials Science Forum, 443-4, 127, 2004 |
| 4 |
Assumptions in thin film residual stress methods Vermeulen AC Materials Science Forum, 404-7, 35, 2002 |
| 5 |
Peak shift correction for transparency in classical XRD residual stress methods Vermeulen AC Materials Science Forum, 378-3, 166, 2001 |
| 6 |
Determination of alignment errors in classical XRD residual stress methods Vermeulen AC, Houtman E Materials Science Forum, 347-3, 17, 2000 |