검색결과 : 3건
No. | Article |
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1 |
Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET Ioannidis EG, Rohracher K, Roger F, Pflanzl WC, Leisenberger FP, Wachmann E, Seebacher E, Vescoli V Solid-State Electronics, 135, 1, 2017 |
2 |
Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET Ioannidis EG, Pflanzl WC, Stueckler E, Vescoli V, Carniello S, Seebacher E Solid-State Electronics, 126, 158, 2016 |
3 |
Dimensionality-driven insulator-to-metal transition in the Bechgaard salts Vescoli V, Degiorgi L, Henderson W, Gruner C, Starkey KP, Montgomery LK Science, 281(5380), 1181, 1998 |