검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
1/f noise measurements in n-channel MOSFETs processed in 0.25 mu m technology - Extraction of BSIM3v3 noise parameters Allogo YA, de Murcia M, Vildeuil JC, Valenza M, Llinares P, Cottin D Solid-State Electronics, 46(3), 361, 2002 |