검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry Necas D, Vodak J, Ohlidal I, Ohlidal M, Majumdar A, Zajickkova L Applied Surface Science, 350, 149, 2015 |
| 2 |
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F Thin Solid Films, 571, 573, 2014 |