| 1 |
The Gaussian-Lorentzian Sum, Product, and Convolution (Voigt) functions in the context of peak fitting X-ray photoelectron spectroscopy (XPS) narrow scans
Jain V, Biesinger MC, Linford MR
Applied Surface Science, 447, 548, 2018 |
| 2 |
IR-spectroscopic studies of hydrogen-bonding solutions: Lineshape analysis of ethanol plus hexane system
Yokozeki A, Kasprzak DJ, Shiflett MB
Applied Energy, 84(9), 863, 2007 |
| 3 |
Line broadening analysis using FullProf*: Determination of microstructural properties
Rodriguez-Carvajal J, Roisnel T
Materials Science Forum, 443-4, 123, 2004 |
| 4 |
Observations on two commonly used profile shape functions
Courant B, Bourniquel B, Francois M, Bessiere M
Materials Science Forum, 347-3, 23, 2000 |
| 5 |
Characterization of zinc-nickel alloys obtained from an industrial chloride bath
Barcelo G, Garcia E, Sarret M, Muller C
Journal of Applied Electrochemistry, 28(10), 1113, 1998 |
| 6 |
Microstructural study of boron doped diamond films by X-ray diffraction profiles analysis
Brunet F, Germi P, Pernet M
Thin Solid Films, 322(1-2), 143, 1998 |
| 7 |
Powder Diffraction Investigations of Plasma-Sprayed Zirconia
Bondars B, Heidemane G, Grabis J, Laschke K, Boysen H, Schneider J, Frey F
Journal of Materials Science, 30(6), 1621, 1995 |
| 8 |
Line Shape Asymmetries in Ar-Broadened HF(V=1-0) in the Dicke-Narrowing Regime
Pine AS
Journal of Chemical Physics, 101(5), 3444, 1994 |
| 9 |
Influence of Low-Energy Ion-Bombardment on the Properties of Tin Films Deposited by RF Magnetron Sputtering
Jouan PY, Lemperiere G
Thin Solid Films, 237(1-2), 200, 1994 |
