검색결과 : 2건
No. | Article |
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1 |
Spatial metrology of dopants in silicon with exact lattice site precision Usman M, Bocquel J, Salfi J, Voisin B, Tankasala A, Rahman R, Simmons MY, Rogge S, Hollenberg LCL Nature Nanotechnology, 11(9), 763, 2016 |
2 |
Scaling of Trigate nanowire (NW) MOSFETs to sub-7 nm width: to Single Electron Transistor Deshpande V, Barraud S, Jehl X, Wacquez R, Vinet M, Coquand R, Roche B, Voisin B, Triozon F, Vizioz C, Tosti L, Previtali B, Perreau P, Poiroux T, Sanquer M, Faynot O Solid-State Electronics, 84, 179, 2013 |