검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector Baker JL, Jimison LH, Mannsfeld S, Volkman S, Yin S, Subramanian V, Salleo A, Alivisatos AP, Toney MF Langmuir, 26(11), 9146, 2010 |