검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electrical Control of Surface Electromigration Damage Vook RW Thin Solid Films, 305(1-2), 286, 1997 |
| 2 |
In-Situ Ultra-High-Vacuum Studies of Electromigration in Copper-Films Jo BH, Vook RW Thin Solid Films, 262(1-2), 129, 1995 |