검색결과 : 11건
No. | Article |
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1 |
Strain dependent microstructural modifications of BiCrO3 epitaxial thin films Kannan V, Arredondo M, Johann F, Hesse D, Labrugere C, Maglione M, Vrejoiu I Thin Solid Films, 545, 130, 2013 |
2 |
Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films Talkenberger A, Himcinschi C, Weissbach T, Vijayanandhini K, Vrejoiu I, Roder C, Rafaja D, Kortus J Thin Solid Films, 520(14), 4590, 2012 |
3 |
Direct Observation of Continuous Electric Dipole Rotation in Flux-Closure Domains in Ferroelectric Pb(Zr,Ti)O-3 Jia CL, Urban KW, Alexe M, Hesse D, Vrejoiu I Science, 331(6023), 1420, 2011 |
4 |
Direct Evidence for Cation Non-Stoichiometry and Cottrell Atmospheres Around Dislocation Cores in Functional Oxide Interfaces Arredondo M, Ramasse QM, Weyland M, Mahjoub R, Vrejoiu I, Hesse D, Browning ND, Alexe M, Munroe P, Nagarajan V Advanced Materials, 22(22), 2430, 2010 |
5 |
Structural defects and local chemistry across ferroelectric-electrode interfaces in epitaxial heterostructures Arredondo M, Saunders M, Petraru A, Kohlstedt H, Vrejoiu I, Alexe M, Hesse D, Browning ND, Munroe P, Nagarajan V Journal of Materials Science, 44(19), 5297, 2009 |
6 |
Ferroelectric nanostructures Vrejoiu I, Alexe M, Hesse D, Gosele U Journal of Vacuum Science & Technology B, 27(1), 498, 2009 |
7 |
Functional Perovskites - From Epitaxial Films to Nanostructured Arrays Vrejoiu I, Alexe M, Hesse D, Gosele U Advanced Functional Materials, 18(24), 3892, 2008 |
8 |
Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films Jia CL, Mi SB, Urban K, Vrejoiu I, Alexe M, Hesse D Nature Materials, 7(1), 57, 2008 |
9 |
Direct imaging of the spatial and energy distribution of nucleation centres in ferroelectric materials Jesse S, Rodriguez BJ, Choudhury S, Baddorf AP, Vrejoiu I, Hesse D, Alexe M, Eliseev EA, Morozovska AN, Zhang J, Chen LQ, Kalinin SV Nature Materials, 7(3), 209, 2008 |
10 |
Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films Vrejoiu I, Le Rhun G, Pintilie L, Hesse D, Alexe M, Goesele U Advanced Materials, 18(13), 1657, 2006 |