화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Strain dependent microstructural modifications of BiCrO3 epitaxial thin films
Kannan V, Arredondo M, Johann F, Hesse D, Labrugere C, Maglione M, Vrejoiu I
Thin Solid Films, 545, 130, 2013
2 Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films
Talkenberger A, Himcinschi C, Weissbach T, Vijayanandhini K, Vrejoiu I, Roder C, Rafaja D, Kortus J
Thin Solid Films, 520(14), 4590, 2012
3 Direct Observation of Continuous Electric Dipole Rotation in Flux-Closure Domains in Ferroelectric Pb(Zr,Ti)O-3
Jia CL, Urban KW, Alexe M, Hesse D, Vrejoiu I
Science, 331(6023), 1420, 2011
4 Direct Evidence for Cation Non-Stoichiometry and Cottrell Atmospheres Around Dislocation Cores in Functional Oxide Interfaces
Arredondo M, Ramasse QM, Weyland M, Mahjoub R, Vrejoiu I, Hesse D, Browning ND, Alexe M, Munroe P, Nagarajan V
Advanced Materials, 22(22), 2430, 2010
5 Structural defects and local chemistry across ferroelectric-electrode interfaces in epitaxial heterostructures
Arredondo M, Saunders M, Petraru A, Kohlstedt H, Vrejoiu I, Alexe M, Hesse D, Browning ND, Munroe P, Nagarajan V
Journal of Materials Science, 44(19), 5297, 2009
6 Ferroelectric nanostructures
Vrejoiu I, Alexe M, Hesse D, Gosele U
Journal of Vacuum Science & Technology B, 27(1), 498, 2009
7 Functional Perovskites - From Epitaxial Films to Nanostructured Arrays
Vrejoiu I, Alexe M, Hesse D, Gosele U
Advanced Functional Materials, 18(24), 3892, 2008
8 Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films
Jia CL, Mi SB, Urban K, Vrejoiu I, Alexe M, Hesse D
Nature Materials, 7(1), 57, 2008
9 Direct imaging of the spatial and energy distribution of nucleation centres in ferroelectric materials
Jesse S, Rodriguez BJ, Choudhury S, Baddorf AP, Vrejoiu I, Hesse D, Alexe M, Eliseev EA, Morozovska AN, Zhang J, Chen LQ, Kalinin SV
Nature Materials, 7(3), 209, 2008
10 Intrinsic ferroelectric properties of strained tetragonal PbZr0.2Ti0.8O3 obtained on layer-by-layer grown, defect-free single-crystalline films
Vrejoiu I, Le Rhun G, Pintilie L, Hesse D, Alexe M, Goesele U
Advanced Materials, 18(13), 1657, 2006