검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS Rostam-Khani P, Philipsen J, Jansen E, Eberhard H, Vullings P Applied Surface Science, 252(19), 7255, 2006 |
| 2 |
Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF Rostam-Khani P, Hopstaken MJP, Vullings P, Noij G, O'Halloran O, Claassen W Applied Surface Science, 231-2, 720, 2004 |