검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Fracture strength of silicon wafers sawn by fixed diamond wire saw Liu TY, Ge PQ, Bi WB, Wang PZ Solar Energy, 157, 427, 2017 |
| 2 |
The impact of wafering on organic and inorganic surface contaminations Meyer S, Wahl S, Timmel S, Kopge R, Jang BY Applied Surface Science, 378, 384, 2016 |
| 3 |
Detailed statistical contact angle analyses; "slow moving" drops on inclining silicon-oxide surfaces Schmitt M, Gross K, Grub J, Heib F Journal of Colloid and Interface Science, 447, 229, 2015 |
| 4 |
Statistical contact angle analyses; "slow moving" drops on a horizontal silicon-oxide surface Schmitt M, Grub J, Heib F Journal of Colloid and Interface Science, 447, 248, 2015 |
| 5 |
Silicon surface passivation by hot-wire CVD Si thin films studied by in situ surface spectroscopy Gielis JJH, Hoex B, van den Oever PJ, de Sanden MCMV, Kessels WMM Thin Solid Films, 517(12), 3456, 2009 |
| 6 |
Impact of iron contamination and roughness generated in ammonia hydrogen peroxide mixtures (SC1) on 5 nm gate oxides De Gendt S, Knotter DM, Kenis K, Mertens PW, Heyns MM Journal of the Electrochemical Society, 145(7), 2589, 1998 |
| 7 |
The Prevention of Si Pitting in Hydrofluoric-Acid Cleaning by Additions of Hydrochloric-Acid Chung BC, Marshall GA, Pearce CW, Yanders KP Journal of the Electrochemical Society, 144(2), 652, 1997 |
| 8 |
Electrochemical Investigation of Copper Contamination on Silicon-Wafers from HF Solutions Jeon JS, Raghavan S, Parks HG, Lowell JK, Ali I Journal of the Electrochemical Society, 143(9), 2870, 1996 |
| 9 |
Total Room-Temperature Wet Cleaning for Si Substrate Surface Ohmi T Journal of the Electrochemical Society, 143(9), 2957, 1996 |