검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Ellipsometric studies on semiconductor microcavity IR-detector structures Rheinlander B, Kovac J, Hecht JD, Borgulova J, Uherek F, Waclawek J, Gottschalch V, Barna P Thin Solid Films, 313-314, 599, 1998 |
| No. | Article |
|---|---|
| 1 |
Ellipsometric studies on semiconductor microcavity IR-detector structures Rheinlander B, Kovac J, Hecht JD, Borgulova J, Uherek F, Waclawek J, Gottschalch V, Barna P Thin Solid Films, 313-314, 599, 1998 |