화학공학소재연구정보센터
검색결과 : 35건
No. Article
1 Model reduction by time aggregation for optimal design of energy supply systems by an MILP hierarchical branch and bound method
Yokoyama R, Shinano Y, Wakayama Y, Wakui T
Energy, 181, 782, 2019
2 Structural characterization and transistor properties of thickness-controllable MoS2 thin films
Jeong Y, Sung JY, Choi Y, Jin JS, Yoon JH, Heo S, Hayakawa R, Wakayama Y
Journal of Materials Science, 54(10), 7758, 2019
3 Periodontal tissue regeneration using the cytokine cocktail mimicking secretomes in the conditioned media from human mesenchymal stem cells
Sakaguchi K, Katagiri W, Osugi M, Kawai T, Sugimura-Wakayama Y, Hibi H
Biochemical and Biophysical Research Communications, 484(1), 100, 2017
4 Soluble 2,6-Bis(4-pentylphenylethynyl)anthracene as a High Hole Mobility Semiconductor for Organic Field-effect Transistors
Takaki Y, Wakayama Y, Ishiguro Y, Hayakawa R, Yamagishi M, Okamoto T, Takeya J, Yoza K, Kobayashi K
Chemistry Letters, 45(12), 1403, 2016
5 Hybrid White Light Emitting Diode Based on Silicon Nanocrystals
Ghosh B, Masuda Y, Wakayama Y, Imanaka Y, Inoue J, Hashi K, Deguchi K, Yamada H, Sakka Y, Ohki S, Shimizu T, Shirahata N
Advanced Functional Materials, 24(45), 7151, 2014
6 Integration of molecular functions into Si device for nanoscale molecular devices
Wakayama Y, Hayakawa R
Thin Solid Films, 554, 2, 2014
7 One-step fabrication of large-scaled indium tin oxide/poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)/poly(3-hex ylthiophene-2,5-diyl):[6,6]-phenyl-C61-butyric acid methyl ester multi-layered structure
Hu JC, Shirai Y, Han LY, Wakayama Y
Thin Solid Films, 554, 46, 2014
8 Layer-by-layer growth of precisely controlled hetero-molecular multi-layers and superlattice structures
Hiroshiba N, Hill JP, Hayakawa R, Ariga K, Matsuishi K, Wakayama Y
Thin Solid Films, 554, 74, 2014
9 Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface
Nagata T, Oh S, Yamashita Y, Yoshikawa H, Ikeno N, Kobayashi K, Chikyow T, Wakayama Y
Thin Solid Films, 554, 194, 2014
10 Resolving lateral and vertical structures by ellipsometry using wavelength range scan
Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M
Thin Solid Films, 571, 579, 2014