1 |
Model reduction by time aggregation for optimal design of energy supply systems by an MILP hierarchical branch and bound method Yokoyama R, Shinano Y, Wakayama Y, Wakui T Energy, 181, 782, 2019 |
2 |
Structural characterization and transistor properties of thickness-controllable MoS2 thin films Jeong Y, Sung JY, Choi Y, Jin JS, Yoon JH, Heo S, Hayakawa R, Wakayama Y Journal of Materials Science, 54(10), 7758, 2019 |
3 |
Periodontal tissue regeneration using the cytokine cocktail mimicking secretomes in the conditioned media from human mesenchymal stem cells Sakaguchi K, Katagiri W, Osugi M, Kawai T, Sugimura-Wakayama Y, Hibi H Biochemical and Biophysical Research Communications, 484(1), 100, 2017 |
4 |
Soluble 2,6-Bis(4-pentylphenylethynyl)anthracene as a High Hole Mobility Semiconductor for Organic Field-effect Transistors Takaki Y, Wakayama Y, Ishiguro Y, Hayakawa R, Yamagishi M, Okamoto T, Takeya J, Yoza K, Kobayashi K Chemistry Letters, 45(12), 1403, 2016 |
5 |
Hybrid White Light Emitting Diode Based on Silicon Nanocrystals Ghosh B, Masuda Y, Wakayama Y, Imanaka Y, Inoue J, Hashi K, Deguchi K, Yamada H, Sakka Y, Ohki S, Shimizu T, Shirahata N Advanced Functional Materials, 24(45), 7151, 2014 |
6 |
Integration of molecular functions into Si device for nanoscale molecular devices Wakayama Y, Hayakawa R Thin Solid Films, 554, 2, 2014 |
7 |
One-step fabrication of large-scaled indium tin oxide/poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)/poly(3-hex ylthiophene-2,5-diyl):[6,6]-phenyl-C61-butyric acid methyl ester multi-layered structure Hu JC, Shirai Y, Han LY, Wakayama Y Thin Solid Films, 554, 46, 2014 |
8 |
Layer-by-layer growth of precisely controlled hetero-molecular multi-layers and superlattice structures Hiroshiba N, Hill JP, Hayakawa R, Ariga K, Matsuishi K, Wakayama Y Thin Solid Films, 554, 74, 2014 |
9 |
Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface Nagata T, Oh S, Yamashita Y, Yoshikawa H, Ikeno N, Kobayashi K, Chikyow T, Wakayama Y Thin Solid Films, 554, 194, 2014 |
10 |
Resolving lateral and vertical structures by ellipsometry using wavelength range scan Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M Thin Solid Films, 571, 579, 2014 |