검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Investigation of plasma damage effects on characteristics and reliability of MOS devices with thin gate dielectrics Brozek T, Huber J, Walls J Solid-State Electronics, 45(8), 1299, 2001 |
| No. | Article |
|---|---|
| 1 |
Investigation of plasma damage effects on characteristics and reliability of MOS devices with thin gate dielectrics Brozek T, Huber J, Walls J Solid-State Electronics, 45(8), 1299, 2001 |