화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Oxide-related defects in quantum dot containing Si-rich silicon nitride films
Walsh LA, Mohammed S, Sampat SC, Chabal YJ, Malko AV, Hinkle CL
Thin Solid Films, 636, 267, 2017
2 A spectroscopic method for the evaluation of surface passivation treatments on metal-oxide-semiconductor structures
Walsh LA, Hurley PK, Lin J, Cockayne E, O'Regan TP, Woicik JC, Hughes G
Applied Surface Science, 301, 40, 2014
3 IDH1 mutation is sufficient to establish the glioma hypermethylator phenotype
Turcan S, Rohle D, Goenka A, Walsh LA, Fang F, Yilmaz E, Campos C, Fabius AWM, Lu C, Ward PS, Thompson CB, Kaufman A, Guryanova O, Levine R, Heguy A, Viale A, Morris LGT, Huse JT, Mellinghoff IK, Chan TA
Nature, 483(7390), 479, 2012