| 1 |
What do we want from computer simulation of SIMS using clusters?
Webb RP
Applied Surface Science, 255(4), 1223, 2008 |
| 2 |
Interaction of the end of range defect band with the upper buried oxide interface for B and BF2 implants in Si and silicon on insulator with and without preamorphizing implant
Kah M, Smith AJ, Hamilton JJ, Sharp J, Yeong SH, Colombeau B, Gwilliam R, Webb RP, Kirkby KJ
Journal of Vacuum Science & Technology B, 26(1), 347, 2008 |
| 3 |
Antimony for n-type metal oxide semiconductor ultrashallow junctions in strained Si: A superior dopant to arsenic?
Bennett NS, Smith AJ, Gwilliam RM, Webb RP, Sealy BJ, Cowern NEB, O'Reilly L, McNally PJ
Journal of Vacuum Science & Technology B, 26(1), 391, 2008 |
| 4 |
Glancing incidence scattering of hyperthermal He+, Xe+, and C-60(+) from graphite: Angular and velocity distributions of neutrals
Hillenkamp M, Pfister J, Kappes MM, Webb RP
Journal of Chemical Physics, 111(22), 10303, 1999 |
| 5 |
Scanning-Tunneling-Microscopy Observation of the Growth Evolution of Gold-Films Evaporated on Highly Oriented Pyrolitic Graphite
Hammiche A, Webb RP, Wilson IH
Journal of Vacuum Science & Technology B, 12(3), 1413, 1994 |
