검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Depth Profiling of Porous Silicon Layers by Attenuated Total-Reflection Spectroscopy Theiss W, Wernke M, Offermann V Thin Solid Films, 255(1-2), 181, 1995 |
| No. | Article |
|---|---|
| 1 |
Depth Profiling of Porous Silicon Layers by Attenuated Total-Reflection Spectroscopy Theiss W, Wernke M, Offermann V Thin Solid Films, 255(1-2), 181, 1995 |