검색결과 : 5건
No. | Article |
---|---|
1 |
Dendrimer-based self-assembled monolayers as resists for scanning probe lithography Tully DC, Wilder K, Frechet JMJ, Trimble AR, Quate CF Advanced Materials, 11(4), 314, 1999 |
2 |
Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current Wilder K, Quate CF Journal of Vacuum Science & Technology B, 17(6), 3256, 1999 |
3 |
Electron beam and scanning probe lithography: A comparison Wilder K, Quate CF, Singh B, Kyser DF Journal of Vacuum Science & Technology B, 16(6), 3864, 1998 |
4 |
Hybrid Atomic-Force Scanning Tunneling Lithography Wilder K, Soh HT, Atalar A, Quate CF Journal of Vacuum Science & Technology B, 15(5), 1811, 1997 |
5 |
Atomic-Force Microscopy for Cross-Section Inspection and Metrology Wilder K, Quate CF, Singh B, Alvis R, Arnold WH Journal of Vacuum Science & Technology B, 14(6), 4004, 1996 |