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Stoichiometry-structure correlation of epitaxial Ce1-xPrxO2-delta (X=0-1) thin films on Si(111) Zoellner MH, Zaumseil P, Wilkens H, Gevers S, Wollschlager J, Baumer M, Xie YH, Niu G, Schroeder T Journal of Crystal Growth, 355(1), 159, 2012 |