검색결과 : 20건
| No. | Article |
|---|---|
| 1 |
The use of Nafion membranes to measure H-2/H-1 and O-18/O-16 isotopic ratios in water Dias VL, Hoang HQ, Martinez-Carreras N, Barnich F, Wirtz T, McDonnell JJ, Pfister L Journal of Membrane Science, 572, 128, 2019 |
| 2 |
Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS Kumar P, Pfeffer M, Willsch B, Eibl O, Yedra L, Eswara S, Audinot JN, Wirtz T Solar Energy Materials and Solar Cells, 160, 398, 2017 |
| 3 |
Phase separation in NiCrN coatings induced by N-2 addition in the gas phase: A way to generate magnetic thin films by reactive sputtering of a non-magnetic NiCr target Luciu I, Duday D, Choquet P, Perigo EA, Michels A, Wirtz T Applied Surface Science, 389, 578, 2016 |
| 4 |
Intrinsic Halide Segregation at Nanometer Scale Determines the High Efficiency of Mixed Cation/Mixed Halide Perovskite Solar Cells Gratia P, Grancini G, Audinot JN, Jeanbourquin X, Mosconi E, Zimmermann I, Dowsett D, Lee Y, Gratzel M, De Angelis F, Sivula K, Wirtz T, Nazeeruddin MK Journal of the American Chemical Society, 138(49), 15821, 2016 |
| 5 |
Differential ion beam sputtering of segregated phases in aluminum casting alloys Nguyen CL, Wirtz T, Fleming Y, Metson JB Applied Surface Science, 265, 489, 2013 |
| 6 |
Application of the storing matter technique to the analysis of boron doped and implanted SiO2/Si Mansilla C, Wirtz T Applied Surface Science, 258(10), 4813, 2012 |
| 7 |
Oxidation effect on the SIMS analysis of samples sputtered and deposited by the Storing Matter technique Mansilla C, Wirtz T Applied Surface Science, 258(15), 5698, 2012 |
| 8 |
Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy Fleming Y, Wirtz T, Gysin U, Glatzel T, Wegmann U, Meyer E, Maier U, Rychen J Applied Surface Science, 258(4), 1322, 2011 |
| 9 |
Application of the Storing Matter technique to the analysis of semiconductor materials Mansilla C, Wirtz T Journal of Vacuum Science & Technology B, 28(1), C1C71, 2010 |
| 10 |
Quantification of a Ti(CxN1-x) based multilayer by Auger Electron Spectroscopy Guillot J, Wirtz T, Girot T, Penoy M, Migeon HN, Barbier G Applied Surface Science, 256(3), 773, 2009 |