검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Tailoring the stress-depth profile in thin films; the case of gamma'-Fe4N1-x Wohlschlogel M, Welzel U, Mittemeijer EJ Thin Solid Films, 520(1), 287, 2011 |
| 2 |
Interdiffusion and stress development in Cu-Pd thin film diffusion couples Kuru Y, Wohlschlogel M, Welzel U, Mittemeijer EJ Thin Solid Films, 516(21), 7615, 2008 |
| 3 |
An X-ray diffraction method to determine stress at constant penetration/information depth Kumar A, Welzel U, Wohlschlogel M, Baumann W, Mittemeijer EJ Materials Science Forum, 524-525, 13, 2006 |
| 4 |
Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths Wohlschlogel M, Baumann W, Welzel U, Mittemeijer EJ Materials Science Forum, 524-525, 19, 2006 |
| 5 |
Interdiffusion and stress development in thin film diffusion couples Kuru Y, Chakraborty J, Welzel U, Wohlschlogel M, Mittemeijer EJ Materials Science Forum, 524-525, 801, 2006 |