검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry Wongmanerod C, Zangooie S, Arwin H Applied Surface Science, 172(1-2), 117, 2001 |
| No. | Article |
|---|---|
| 1 |
Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry Wongmanerod C, Zangooie S, Arwin H Applied Surface Science, 172(1-2), 117, 2001 |